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dc.contributor.authorRayudu, K V B V-
dc.date.accessioned2023-12-14T09:26:31Z-
dc.date.available2023-12-14T09:26:31Z-
dc.date.issued2022-
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/612-
dc.language.isoenen_US
dc.subjectEfficient Testingen_US
dc.subjectFault Diagnosisen_US
dc.titleSome Investigations on Efficient Testing & Fault Diagnosis Algorithms for VLSI Circuitsen_US
dc.typeThesisen_US
Appears in Collections:Electronics and Communication Engineering

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