Please use this identifier to cite or link to this item:
http://localhost:8080/xmlui/handle/123456789/612| Title: | Some Investigations on Efficient Testing & Fault Diagnosis Algorithms for VLSI Circuits |
| Authors: | Rayudu, K V B V |
| Keywords: | Efficient Testing Fault Diagnosis |
| Issue Date: | 2022 |
| URI: | http://localhost:8080/xmlui/handle/123456789/612 |
| Appears in Collections: | Electronics and Communication Engineering |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Thesis_701358.pdf | 5.12 MB | Adobe PDF | View/Open |
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