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Title: | On-chip CMOS temperature sensor with current calibrated accuracy of -1.1°C to +1.4°C (3?) from -20°C to 150°C |
Authors: | Bashir, Mudasir Patri, Sreehari Rao KSR, Krishnaprasad |
Keywords: | Negative Bias Thermal Instability Current starved ring oscillator |
Issue Date: | 2015 |
Publisher: | 19th International Symposium on VLSI Design and Test, VDAT 2015 - Proceedings |
Citation: | 10.1109/ISVDAT.2015.7208056 |
Abstract: | This paper proposes a new sensor circuit to monitor on-chip frequency temperature changes in VLSI circuits. The proposed circuit exploits the temperature dependency of current/voltage of metal-oxide-semiconductor field effect transistor. The variation of current/voltage in the temperature sensor circuit with respect to temperature is subjected to a ring oscillator which provides the relative frequency translation. The circuit is implemented in 0.18µm CMOS technology for a temperature range of -20o C to +150 oC, operates with two point calibration, having an uncertainty of -1.1o C to +1.4o C, consumes a low energy of 0.31nJ per sample and a power consumption of 0.093µW at 12MHz frequency. A switch is used at reference clock frequency to perform self-calibration, hence removing the effects of mismatch and process variation. |
Description: | NITW |
URI: | http://localhost:8080/xmlui/handle/123456789/2398 |
Appears in Collections: | Electronics and Communication Engineering |
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File | Description | Size | Format | |
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On-chip_CMOS_temperature_sensor_with_current_calibrated_accuracy_of_1.1C_to_1.4C_3_from_20C_to_150C.pdf | 994.59 kB | Adobe PDF | View/Open |
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