Effect of Conductor Thickness on On-Chip 3-D Inductor for RF Applications

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DC Field	Value	Language
dc.contributor.author	Deevi, B V N S M Nagesh	-
dc.contributor.author	Rao, N Bheema	-
dc.date.accessioned	2025-01-02T06:46:12Z	-
dc.date.available	2025-01-02T06:46:12Z	-
dc.date.issued	2015	-
dc.identifier.citation	10.1109/IIC.2015.7150823	en_US
dc.identifier.uri	http://localhost:8080/xmlui/handle/123456789/2337	-
dc.description	NITW	en_US
dc.description.abstract	On-chip inductors are characterized based on Quality factor, Inductance and Self resonant frequency values. These values depend on dimensions of the conductor. Quality factor of an inductor is highly dependent on conductor thickness, as conductor thickness increases Q value increases. In this paper simulation is carried out for inductor by varying conductor thickness to O.5Ilm, 111m, 211m. The frequency response of this inductor by varying conductor thickness is observed from frequency range 1O-100GHz, suitable for RF/Microwave applications. Simulation of proposed inductor is carried out in IE3D EM field solver to obtain quality factor and inductance values. Proposed inductor has area of cross-section 10xlOIlm2 on silicon chip.	en_US
dc.language.iso	en	en_US
dc.publisher	2015 International Conference on Industrial Instrumentation and Control, ICIC 2015	en_US
dc.subject	Conductor thickness	en_US
dc.subject	Inductance	en_US
dc.title	Effect of Conductor Thickness on On-Chip 3-D Inductor for RF Applications	en_US
dc.type	Other	en_US
Appears in Collections:	Electronics and Communication Engineering

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