Please use this identifier to cite or link to this item:
http://localhost:8080/xmlui/handle/123456789/1327Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | SHASHIKANTH, P.B. | - |
| dc.contributor.author | PRASAD, P.B.V. | - |
| dc.contributor.author | SAMBASIVA RAO, G. | - |
| dc.date.accessioned | 2024-10-30T09:45:27Z | - |
| dc.date.available | 2024-10-30T09:45:27Z | - |
| dc.date.issued | 1999 | - |
| dc.identifier.uri | http://localhost:8080/xmlui/handle/123456789/1327 | - |
| dc.description | NITW | en_US |
| dc.description.abstract | Studies on thin dotriacontane hydrocarbon in the form of thin films were made by employing Oblique Incidence Reflection Microscopy (OIRM). Information related to substructure and striations were discussed. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Crystal Research and Technology | en_US |
| dc.subject | OIR microscopy | en_US |
| dc.subject | Hydrocarbons | en_US |
| dc.subject | Thin films | en_US |
| dc.title | Oblique Incidence Reflection Microscopy (OIRM) Study on Hydrocarbon Films | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | Metallurgical and Materials Engineering | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 291521-407929343C12873Aaid-crat12873B2-b.pdf | 242.43 kB | Adobe PDF | View/Open |
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