Please use this identifier to cite or link to this item:
http://localhost:8080/xmlui/handle/123456789/1327| Title: | Oblique Incidence Reflection Microscopy (OIRM) Study on Hydrocarbon Films |
| Authors: | SHASHIKANTH, P.B. PRASAD, P.B.V. SAMBASIVA RAO, G. |
| Keywords: | OIR microscopy Hydrocarbons Thin films |
| Issue Date: | 1999 |
| Publisher: | Crystal Research and Technology |
| Abstract: | Studies on thin dotriacontane hydrocarbon in the form of thin films were made by employing Oblique Incidence Reflection Microscopy (OIRM). Information related to substructure and striations were discussed. |
| Description: | NITW |
| URI: | http://localhost:8080/xmlui/handle/123456789/1327 |
| Appears in Collections: | Metallurgical and Materials Engineering |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 291521-407929343C12873Aaid-crat12873B2-b.pdf | 242.43 kB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.